Storage Testing & Validation Solutions
Overview
DACNEL Storage Testing & Validation Solutions are designed for SSD qualification, burn-in testing, compatibility verification, and production-level validation of NVMe storage devices. The solution enables high-density parallel testing with stable signal integrity, hot-swap capability, and high-temperature chamber operation for reliable long-term stress and performance validation.
Built for SSD manufacturers, storage system integrators, and R&D laboratories, the platform supports scalable multi-drive testing environments with flexible PCIe and MCIO-based architectures.
M.2 SSD Validation Platform Architecture
This solution is built around a high-density PCIe switch + multi-port M.2 test board architecture, enabling simultaneous validation of multiple NVMe SSDs under controlled test conditions.
System Architecture
Core Testing Capabilities
High-Density Parallel Testing
Supports simultaneous validation of up to 8 NVMe M.2 SSDs, improving efficiency in qualification and production environments.
Hot-Swap & Open-Card Operation
XIC 3342-8I supports hot-swappable SSD insertion and removal, enabling continuous testing workflows without system downtime.
High-Temperature Chamber Compatibility
The test board is designed for operation inside thermal chambers, supporting burn-in, aging, and reliability stress testing under elevated temperature conditions.
Independent Drive Control
Each M.2 slot operates independently for power and signal control, enabling precise failure analysis and performance profiling.
Production & R&D Validation
Suitable for SSD firmware validation, compatibility testing, endurance testing, and mass production screening.
Recommended Products
STC PE3163-8I PCIe Switch Card
A high-performance PCIe switch-based controller card that provides 8 independent downstream PCIe lanes for NVMe storage testing and expansion. Ideal for multi-drive validation platforms without motherboard bifurcation limitations.
XIC 3342-8I M.2 SSD Test Board
A high-density 8-port M.2 NVMe SSD test platform designed for validation, burn-in, and compatibility testing. Supports independent drive operation, hot-swap functionality, and high-temperature chamber deployment.
SFF-8643 to SFF-8643 High-Speed Cable
Example reference (SAS3 / 12Gbps class):
Used for high-speed interconnection between PCIe switch cards and test boards, ensuring stable signal transmission in multi-lane NVMe testing environments.
Application Scenarios
• NVMe SSD Validation & Qualification
• Firmware & Compatibility Testing
• Burn-in / Aging Test Systems
• High-Temperature Reliability Testing
• SSD Production Line Screening
• R&D Storage Performance Benchmarking
• Enterprise Storage Development Platforms
Why DACNEL
DACNEL provides a complete storage validation ecosystem integrating PCIe switching, high-density M.2 testing, and high-speed interconnect design.
Key advantages include:
• PCIe switch-based multi-drive architecture
• High-density M.2 NVMe test platforms
• Hot-swap and independent drive control
• High-temperature chamber compatibility
• Stable SFF-8643 high-speed interconnect design
• Scalable validation system architecture
• OEM / ODM customization capability
This solution enables SSD manufacturers and system developers to significantly improve validation efficiency, reduce testing complexity, and accelerate product development cycles.